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A new circuit for at-speed scan SoC testing
In this paper, an on-chip clock (OCC) controller with a bypass function based on an internal phase-locked loop is designed to test faults in SoC. Furthermore ...
Design clock controllers for hierarchical test | EDN
Jul 18, 2014 ... If you use a top-level OCC, the ATPG on each block will be a little less efficient than if each block has an OCC. The OCC clock waveforms need ...
Logic Design for On-Chip Test Clock Generation ... - arXiv.org
highfrequency clock domains. A logic design for on- chip high-speed clock generation, implemented to avoid expensive test equipment, is described in detail.
Patent US20120173943 - Apparatus for at-speed testing, in inter ...
Jul 5, 2012 ... c) a controller circuit (icOCC) interfaced with every clock sourcing logic circuit (OCC) of the different clock domains and adapted to ...
An On-Chip Clock Controller for Testing Fault in System on Chip
In this paper, an on-chip clock (OCC) controller with bypass function based on an internal phase locked loop (PLL) is designed to test the faults in system on chip ...
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